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中国图象图形学报 2003
Study on a Method to Repair Low-ratio S/N Band of Imaging Spectrometer Data Based on the Trend-face of DN Value
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Abstract:
With a consideration of the influence of consecutive multiple bands of images with a low signal to noise (S/N) ratio obtained from imaging spectrometer on the reconstruction of reflectance spectrum, an amending method is developed from the digital number (DN) value of trend-face of low S/N ratio band. On the basis of properly estimated the trend-face of DN average values, the highly correlated signal variances are introduced from adjacent band to amending band under the constraint condition of energy ratio of DN in this method. As a result, not only the influence of original noise band on the reflectance spectrum reconstruction is eliminated accordingly, but also the quality of composed images generated from low-ratio S/N band is improved by this amending method. The results show that the application aim of amending defect bands and restoring spectrum characteristics is realized with the new concept of lower-passfilter.