2D Wavelet Transform with Different Adaptive Wavelet Bases for Regular Texture Defect Inspection
基于二维自适应异小波基小波变换的规则纹理缺陷检测

There are many textures such as woven fabrics having repeating textron. In order to handle the textural characteristics of images with defects, this paper proposes a new method based on two dimensional wavelet transform. In the method, a new concept of different adaptive wavelet bases is used to match the texture pattern. The 2D wavelet transform has two different adaptive orthonormal wavelet bases for rows and columns which differ from Daubechies wavelet bases. The orthonormal wavelet bases for rows and columns are generated by genetic algorithm. The experimental result demonstrates the ability of the different adaptive wavelet bases to characterize the texture and locate the defects in the texture.