CRYSTALLOGRAPHIC PROPERTIES OF AN INHERENT LOW-ENERGY INTERFACE (11)Cu//(0001)_(AIN) IN Cu-AlN BICRYSTAL
CRYSTALLOGRAPHIC　PROPERTIES　OF　AN　INHERENT　LOW－ENERGY　INTERFACE（1■1）Cu／／（0001）_（AIN）IN　Cu－AlN　BICRYS

A model Cu-AlN composite has been prepared by ion implantation technique and annealing. The atomic configuration and lattice relationship of a low-energy inherent interface(11)Cn//(0001)AlN were studied by using transmission electron microscopy and geometrical modelling. By analysing the dichromatic pattern of the composite,a primary structural unit of the interface atomic configuration was determined for purpose of HREM image simulations and of studying the structurul relaxation state in the near-interface region.