Test-Data Generation Guided by Static Defect Detection

Software testing is an important technique to assure the quality of software systems, especially high-confidence systems. To automate the process of software testing, many automatic test-data generation techniques have been proposed. To generate effective test data, we propose a test-data generation technique guided by static defect detection in this paper. Using static defect detection analysis, our approach first identifies a set of suspicious statements which are likely to contain faults, then generates test data to cover these suspicious statements by converting the problem of test-data generation to the constraint satisfaction problem. We performed a case study to validate the effectiveness of our approach, and made a simple comparison with another test-data generation on-line tool, JUnit Factory. The results show that, compared with JUnit Factory, our approach generates fewer test data that are competitive on fault detection. This work is sponsored by the National High-Tech Research and Development 863 Program of China under Grant No. 2007AA010301, the National Natural Science Foundation of China under Grant Nos. 60803012 and 90718016, and China Postdoctoral Science Foundation funded project under Grant No. 20080440254.