Built-in test diagnosis strategy design based on dependency model
基于相关性模型的BIT诊断策略技术研究*

This paper presented an efficient algorithm of built-in test diagnosis strategy based on the dependency model. At first, considering reliability and testing costs based on the dependency matrix, according to the diagnostic strategy model of BIT, the AO* algorithm built the decision-making tree, then test points could be selected based on the information gain values, and a more efficient diagnosis strategy sequence could be constituted. The application example shows that this algorithm ensures to reduce the complexity and improves the BIT fault detection and isolation under less testing costs.