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Design of control module for VME bus fault injection system in BIT experiment
BIT试验中VME总线故障注入设备控制单元设计

Keywords: build-in-test(BIT),VME bus,fault injection,FPGA(field programmable gate arrays)
机内测试
,VME总线,故障注入,现场可编程门阵列

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Abstract:

To realize the BIT experiment for avionics, this paper put forward an architecture of VME bus fault injection equipment based on FPGA. The control module, the key for the fault injecting realization, had the function of the overall control for the equipment. Proposed the software and hardware design of control module for the fault injection equipment and the workflow of the fault injection system in detail, based on the framework of VME bus fault injection equipment. This paper also proposed the design pattern for the control module of fault injection equipment, which contained detailed design techniques and system workflow. Moreover, validated the design and function of control module by test tools. At last, it discussed the research prospect of fault injection technique in BIT experiment.

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