Low-SNR and small target image segmentation algorithm for defect inspection of optical films
低信噪比小检测目标光学薄膜缺陷图像分割算法研究*

Based on error correction theory,this paper proposed a novel algorithm to inspect defects rapidly.With an assumption that only random errors existed in a background image in which the random errors followed a normal distribution,the defect inspection problem converted to a gross error correcting problem,which could be solved naturally by using the 3σ rule.The algorithm applied 2D thresholds generated from neighbor pixels to reduce the influence of noise.A comparison of the computational results with the existing methods indicates that the proposed algorithm is a viable alternative for image segmentation in defect inspection applications.