Coverage-driven Approach in Functional Verification
基于覆盖率的功能验证方法*

With the development of semiconductor technology, verification is becoming the major bottleneck of large scale integrated circuit design. This article introduces several conventional approaches in functional verification, then analyzes and compares all theses techniques' virtue and flaw. Base on an amelioration named coverage-driven approach is imported and it is practically applied in a general-purpose microprocessor functional verification design.