METHOD FOR POLYFAMILY PLANE TRACE ANALYSIS AND ITS APPLICATION
多族晶面迹线分析方法及其应用

The formula for calculating included angle between polyfamily plane traces in foil of lattice systems under both zero tilt and non-zero tilt states was deduced and verified by certain practical examples. The method may be available to index the plane traces of slip, twin and other defects, especially to determine such plane defects as twin planes of {011} and {013} occurred simultaneously in M_7C_3.