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金属学报 1990
A SOLUTION OF MINIMUM NORM FOR QUANTITATIVE PHASE ANALYSIS BY STANDARDLESS X-RAY DIFFRACTION
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Abstract:
A new expression of quantitathe phase analysis by standardless X-ray diffraction has been derived using intensity matrix of vector modulus. The criterion of standardless X-ray diffraction analysis was suggested, so as to separate the diffra- ction pettern of every phase from that of sample. The optimal solution could be obtained by the least squares regression.