Design of A Multi-functional Semiconductor Photoelectric Property Test Circuit
多功能半导体光电性质测试电路的设计

A multi-functional semiconductor photoelectric property test circuit is designed.With the aid of an infrared spectrometer,it can be used to test the photocurrent in the corresponding waveband. Because an AC signal generator module is added in this circuit,it can also be used to test the modulated reflective spectrum of the weak electric field in semiconductor.So,it is of great value to application. Besides a low noise and highly stable electric test condition can be provided for the semiconductor samples,a user-friendly interface which can be used to control and monitor the test condition in real time is provided.The hardware structure of each module of this design is presented and two main chips and their interface circuits for single-chip processors are described in detail.