THE PARTIAL-INTERFERENCED MODEL CALCULATION OF THE SPECTROSCOPY FOR THE MULTI-QUANTUM WELLS
关于多量子阱光谱的部分相干模型计算

The model calculation of the reflection spectroscopy for the multi-layer film system is discussed in detail. Considering the effect of interference length on the film system and the substrate, a simple and useful method to calculate the reflection spectroscopy is presented, and the predominance of this method can be seen from the calculation for the experimental spectroscopy.