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红外与毫米波学报 1997
THE MAGNETORESISTANCE PROPERTIES OF HgCdTe PHOTOCONDUCTIVE DETECTORS
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Abstract:
The magnetoresistance of three HgCdTe photoconductive detectors and one liquid phase epitaxially grown HgCdTe film was measured. The fitting results analyzed by a two carrier model of reduced conductivity tensor (RCT) scheme agree well with the experimental data.