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高分子学报 1993
CRYSTALLEVITY DETERMINATION OF NYLON 1010 BY WIDE-ANGLE X-RAY DIFFRACTION
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Abstract:
Using the atomic scattering factors approximation expression and corrections for angle and temperature, the correct factors of three main crystal planes and amorphous state of nylon 1010 by wide angle X-ray diffraction (WAXD) have been calculated. The equation for the determination of crystallinity of nylon 1010 by WAXD is presented.