Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179

DOI: 10.3390/jlpea2040210

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Abstract:

We have found the following error in the title of this article which was recently published in J. Low Power Electron. Appl. [...]

References

[1]	Chavan, A.; Palakurthi, P.; MacDonald, E.; Neff, J.; Bozeman, E. Hardened Flip-Flop Optimized for Subthreshold Operation Heavy Ion Characterization of a Radiation. J. Low Power Electron. Appl. 2012, 2, 168–179, doi:10.3390/jlpea2020168.

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