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光子学报  2009 

Research on Noise Characteristics of Electron Multiplying Charge Coupled Devices
电子倍增CCD噪声特性研究

Keywords: Low-light-level imaging,Electron multiplying CCD,Noise characteristics,Excess noise factor
微光成像
,电子倍增CCD,噪音特性,过剩噪音因子

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Abstract:

Based on the discussion about noise components and their generating mechanisms of electron multiplying CCDs,total noise theoretical model is established.According to the random of signal multiplication,excess noise factor of the electron multiplying CCD is derived and the limiting value is calculated when gain approaches infinity.Noise measurement of the electron multiplying CCD is carried out at last.Acquisition of output noise waveform and spectrum is done at different gain.The relationship between noise ...

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