An Approach to Measure Pixel Pitch of CCD Camera System by Using Structure Diffraction of TFT-LCD
利用TFT-LCD像素结构衍射测试CCD图像采集系统的像素间距

An approach of measuring the pixel pitch of CCD Camera System is presented by using the diffraction of TFT-LCD structure in VanderLugt optical correlator.Its principle and testing method are studied and a typical of CCD camera system consisted of HN-480 model CCD sensor and OK-C21 model image grasp board is tested.The way did not need extra independent test bed and is suitable for VanderLugt correlator.The measurement results for the pixel pitch of CCD camera system is agreeable to its operational performance.The result shows that this approach has very strong practicability and effectiveness.