Improved Carrier-Wave Electric Speckle Interferometry
一种改进的载波电子散斑干涉处理方法

A new carrier wave electronic speckle method for deformation measurement was proposed. In this method, the deformation was measured by comparing the straight parallel fringes to the carrier wave interferometric fringes in the spatial frequency domain. The calculation of the carrier wave frequency and its induced measurement error are avoided, thus obtaining a higher accuracy. Both the theory and the verifying experiment were presented in this paper.