THEORIES AND ALGORITHMS OF k-FAULT DIAGNOSIS IN ANALOG CIRCUITS WITH TOLERANCES
容差电路k故障诊断理论和方法

By using singular value decomposition, this paper elaborates the quantitative relation among oriented energies of the measurable voltage-change matrix, fault-information matrix and departure-disturbance matrix in departure-fault circuits, describes separation of the maximal oriented energy subspace, and proposes a maximal closeness criterion. Some novel algorithms, under the name of Generalized Inverse Projection (GIP), are presented to locate k-faults. The location accuracy of the GIP is so high as that of the excellent Nonlinear Least Square estimation (NLS), but testing time required by the GIP is only one over several hundreds of that by the NLS.