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材料研究学报 1998
QUANTIATIVE TEXTURE ANALYSIS OF HIGH T_c SUPERCONDUCTING OXIDES BY THE MMEM
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Abstract:
As diffraction patterns of high Tc superconducting oxides are complex with many overlapping diffraction peaks which are difficult to resolve with a conventional X-ray pole figure goniometer, some advanced methods of texture measurement and analysis are required to obtain some quaIitative information about the actual texture of these materials. In this paper, the inverse pole figure of the rolling plane of a Bi-2223 tape is determined by the modified maximum entropy method (MMEM) from three overlapping pole figures. which were measured by X-ray difFraction using a curve position sensitive detector. The textures of this sample consiSt of two components- (001) and (110).both parallel to the rolling plane.