Effect of Thickness on the Rectifying Properties of La0.85Sr0.15MnO3/TiO2 Heterostructures
薄膜厚度对La0.85Sr0.15MnO3/TiO2异质pn结的整流特性的影响

La0.85Sr0.15MnO3 (LSMO)/TiO2 heterostructures are synthesized by RF magnetron sputtering with different LSMO thicknesses.The rectifying properties of the junctions are related to the LSMO thickness and good rectifying properties appear in the LSMO(100nm)/TiO2 junction.Furthermore,an excellent rectifying characteristic is presented over a relatively wide temperature range for LSMO(100nm)/TiO2 heterostructures.All samples exhibit a huge effective resistance,which plays an important role in the I-V curves as well as the rectifying properties.The diffusion potential of the heterostructures decreases as the measurement temperature increases,which is attributed to the modulation of the interface electronic structure of LSMO/TiO2 heterostructures.The metal-insulator (M-I) transition of LSMO also appears in the heterostructures and the increased sheet-resistance of heterostructures at low temperature is related to the introduction of effective resistance.