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Simulation and Experimental Research on a Schottky Gate Resonant Tunneling Transistor
基于肖特基栅共振隧穿三极管的器件模拟与实验分析

Keywords: Schottky gate resonant tunneling transistor,device simulation,depletion region
肖特基栅共振隧穿三极管
,器件模拟,耗尽区

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Abstract:

A Schottky gate resonant tunneling transistor (SGRTT) is fabricated.Relying on simulation by ATLAS software,we find that the gate voltages can be used to control the current of SGRTT when the emitter terminal is grounded and a positive bias voltage is applied to the collector terminal.When the collector terminal is grounded,the gate voltages can control the peak voltage.As revealed by measurement results,the reason is that the gate voltages and the electric field distribution on emitter and collector terminal change the distribution of the depletion region.

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