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半导体学报 2005
Design on an ESD Protection Circuit with GG-NMOS Structure in CMOS Technology
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Abstract:
An ESD protection circuit which uses a GG-NMOS structure is presented.The operating principle and test results are depicted.An improved project,gate-couple technology,on the circuit is presented,and the anticipated effect is achieved.The ability of the circuit achieves class 2 of the human-body model.It is also indicated that ESD induces damage of the gate oxide with microcosmic mechanisms,where ESD occurs based on simulation.