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Detection method for memory overrun in multi-loop programs
一种多重循环程序内存访问越界检测方法

Keywords: software defect detection,static analysis,symbolic execution,loop analysis,CR# algebra
软件缺陷检测
,静态分析,符号执行,循环分析,递推链扩展代数

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Abstract:

A detection method for memory overrun is presented to overcome multi-loop problems: (1)identifies suspicious defects and their dependent regions;(2)analyzes multi-loops by CR# algebra;(3)infers probability of triggering defect and path guide information;(4)detects defects based on symbolic execution;and (5)finds defects,trigger paths,and program input. A prototype tool has been implemented,and it found real defects in several open source softwares. The results show that the new method can avoid blind path t...

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