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无机材料学报 2001
Spectroscopic Ellipsometry Studies of Ba0.9Sr0.1Ti03 Thin Films
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Abstract:
Ellipsometric spectra of Ba0.9Sr0.1TiO3 (BST) thin films with various annealing temperatures were measured in the range of photon energy from 2.1 to 5.2eV. Constructing appropriate fitting models and describing optical properties of the BST with Cauchy dispersion model, their optical constants (refractive index n and extinction coefficient k) spectra and band gap Eg were determined by means of an optimization. Compared these results, we obtained the variation of the refractive index n, the extinction coefficient k and the band gap Eg with annealing temperatures.
