Characterization and Research of Hexagonal Closed Packing Structured ZnO Nano-powders by X-ray Diffraction Method
密堆六方纳米ZnO的X射线衍射表征与研究

The X-ray diffraction (XRD) tests showed that the diffraction lines of hk0, h-k=3n in the hexagonal closed packing structured (HCPS) ZnO appeared only crystallite broadening effect. The two-fold broadening effects of crystallite-fault could be observed in the diffraction lines of h-k=3n±1, yet the selective broadening was not obvious. In this study, the least square method for separating twofold broadening effect of crystallite-fault were proposed and used to characterize the average crystallite size and stacking faults probability of HCPS ZnO. The results show that the average crystallite size and stacking faults probability are related with the preparation methods and the stoichiometric ratio of ZnO.