Prevention of disturbed and False Signals in Scanning Electron Acoustic Microscope
扫描电声显微镜中干扰信号及假信号的预防

The effects of disturbed and false signals on Scanning Electron Acoustic Microscope (SEAM)are presented in this paper. Various reasons such as high electric fields, magnetic fields and high frequency instruments causing the disturbed signals on SEAM are discussed and a sample of detection assembly is give out, simultaneously. Emergence of false signals in SEAM is also analyzed on the bases of the upper surface of the sample earthed and the sample-transducer interface unearthed, the upper surface of the transducer earthed and the surface of the sample unearthed, and with both the upper surface of the sample and the transducer earthed. It would be best that the contrast switch is turned off when electron acoustic images are observed and imaged.