Analysis of figure of merit for thick pinhole imaging
厚针孔射线成像品质因数的研究

A figure of merit (FOM) for thick pinhole imaging and its formula are developed. The FOM can describe the total spatial resolution and sensitivity of thick pinhole imaging. Based on the penetration model, the root-mean-square of point spread function and the effective diameter at the center are derived. FOMs at the total and effective field of view are calculated. Based on the figures, the characteristics of thick pinhole imaging are discussed.