Simulation of incipient spallation experiments of high purity aluminum based on a single void growth model
基于单孔洞近似的高纯铝部分层裂实验的数值模拟研究

By means of a single void growth model, finite element simulations of incipient spallation experiments of high-purity aluminum under different plate impact velocities are carried out. The relationship between the influence of void growth in the sample on wave propagation and the feature of free surface velocity profile is discussed. By analyzing the change of stress field around the void, the occurrence of pullback signal in free surface velocity profiles is attributed to the local unloading wave effect caused by void growth in the sample, which cannot indicate the whole spallation of materials. Free surface velocity profiles and relative void volumes are simulated for different impact velocities and the simulation results are in good agreement with experimental results, which indicates that the stochastic damage evolution in incipiently spalled sample can be described by a single void growth in cell model.