High-resolution electron microscopy of misfit dislocations in AlSb/GaAs(001)system
AlSb/GaAs(001)失配位错的高分辨电子显微学研究书

The detailed core structures of misfit dislocations in the AlSb/GaAs(001) hetero structure system were studied by 200 kV LaB_6 filament high-resolution electron microscope. In combination with image deconvolution, the 110] images were transformed into the projected structure maps, and the image resolution was enhan ced up to the information limit of the microscope. To distinguish Al and Sb atoms in the AlSb film, the image contrast change with the sample thickness was analyzed for the perfect region in dec...