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物理学报  2005 

Raman scattering coefficients of symmetrical stretching modes of microstructural units in sodium silicate melts
硅酸盐熔体微结构单元的对称伸缩模的拉曼散射系数

Keywords: Raman scattering coefficient,Si_O tetrahedron,silicate melt,high_temperature Raman spectra
拉曼散射系数,
,硅氧四面体,,硅酸盐熔体,,高温拉曼谱

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Abstract:

Quantitative analysis of Raman spectra of vitreous or molten si licate is always one of the key subjects in some fields, e.g. materials science, geological physics, etc. But th ere are many difficulties with this analysis, one of which is the determination of Raman scattering coefficient . Not long ago, we developed a new method for the calculation of Raman spectrum of amorphous silicate. Essenti ally, this method combines the molecular dynamics simulation with wilson's GF matrix method, elect ro_optical parameter method and bond polarizability model. With this theoretical method, we have studied the Raman sc attering coefficients of symmetrical stretching modes of Q i in sodium silicate melts, and concluded that these coefficients are independent of composition. Meanwhile, the five values of the coefficients are also given as follows: S 0=1, S 1=0.514, S 2=0.242, S 3=0.090 and S 4=0.015. In order to apply these quantities to experiments, the Raman spectrum of sodium disilicate melt has been measured and its high_frequency envelope has been deconvolved into three Gaussian bands. Finally, the molar frac tions of Q i were achieved by dividing the area fractions of the three Gaussian bands by corresponding scat tering coefficients. Additionally, combining the results of theoretical calculation and quantitative analysis of experimental spectra, we found that the intensities of anti_symmetrical stretching modes of Q 0 and Q 2 in sodium silicate melts are so strong that they cannot be neglected in the deconvolution process.

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