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物理学报  2004 

The structural optical and electrical properties of films prepared by screen print
丝网印刷FeS2(pyrite)薄膜的结构及光电性能

Keywords: screen print,thin films,struture,Rietveld methods,properties
丝网印刷,
,薄膜,,结构,,Rietveld方法,,光电性能

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Abstract:

Thin films of iron pyrite(FeS 2)have been prepared by screen print. X ray diffraction (XRD) patterns were used to identify the nature of the films. Special attention has been devoted to the structural parameters(cell and sulfur positional parameter), bond distances and angles, lattice constants. The procedure used in this study was the full profile refinement of x ray powder diffraction patterns using the Rietveld method. Here we report on the influnce of film thickness for resitivity, Hall mobility and optical energy gap etc.

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