Simulation of effect of atomic process on poloidal CXRS measurement
原子过程对极向CXRS测量影响的数值模拟

With consideration of the effects of atomic process, a simple code modeling the correction to poloidal charge-exchange recombination spectroscopy (CXRS) measure ment is developed. The simulation results show that the measured poloidal veloci ty shift is overestimated in the ion diamagnetic drift direction and the apparen t ion temperature is underestimated because of the effects of energy-dependent e mission rate and finite lifetime of excited ions. This deviation will be more ob vious with the increase of temperature or magnetic field. The contributions from gradients of density and temperature are negligible compared to that from the a tomic process.