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物理学报 2003
The theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopy
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Abstract:
In this paper,the interactions between the tip of the scanning tip microwave near-field microscopy and the nonlinear dielectric material were analyzed.The theoretical calibration coefficient in the measurement of nonlinear dielectric constant as a function of dielectric constant was obtained.The contributions to the coefficient from different directions and the resolution limit were also discussed.