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物理学报 2001
A NOVEL METHOD TO MEASURE THE THICKNESS OF YBCO THIN FILM
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Abstract:
The laser induced voltage effect had been found in HTSC YBCO thin film grown on vicinal cut SrTiO3 substrate. The relationship between the decay time constant of response signal and the thickness of YBCO thin film was studied. It was found that the relationship between the decay time constant and the film thickness can be fitted by a fitting curve. The film thickness can be obtained from the fitting. We discussed the error induced to the fitting.
