APPLICATION OF X-RAY PROFILE FOURIER ANALYSIS TO PREDICT MECHANICAL PROPERTIES OF ALLOYS
多晶X射线线形傅氏分析方法在合金材料力学性能预测上的应用

The defect configuration relates directly to the mechanical behaviour of structural materials. Especially, dislocation substructure, DSS, is one of the most important configurations. In this paper, a realistic x-ray diffraction profile analysis of DSS, developed by Wang, is reviewed and illustrated. Its application to predicting quantitatively mechanical properties is made.