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物理学报 1986
ANALYSIS OF THE LATTICE IMAGE OF INTERFACE BETWEEN AMERPHOUS REGION AND CRYSTALLINE REGION IN GaAs WITH OPTICAL DIFFRACTOMETER
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Abstract:
We analysed the high resolution lattice image of interface between crystalline region and amorphous region produced by ion implantation in GaAs with optical diffra-ctometer. The preliminary results show the structure variation at the interface. There are five districts from amorphous to crystalline region. They are: amcrphous area; nuclei, crystallite and low dimensional ordered area; polycrystalline area; distorted mo-nocrystalline area; and monocrystalline area.