|
物理学报 1993
STUDY ON STRUCTURAL AND VIBRATIONAL PROPERTIES OF AMORPHOUS SILICON FILMS USING A SIMULATING ANNEALING MODEL
|
Abstract:
We have performed simulating annealing in computer by using Monte Carlo technique to produce a random-network model of amorphous silicon. The structural characteristics of this model is in good agretment with that of real sample. Its vibrationol densities of states have been calculated with molecular-dynamics method. The relationships between its locaiized vibrational modes and the structural defects have also been discussed.