APPLICATION OF THE ANOMALOUS SCATTERING EFFECT IN TREATING THE PROBLEM OF DOUBLE IMAGES RESULTING FROM PATTERSON ANALYSIS
反常散射效应在处理Patterson法双解中的应用

In this paper a procedure is given, which makes use of the anomalous scattering effect in two dimensional reflections to discriminate the two-fold possibilities of atomic positions resulting from the analysis of certain three dimensinal Patterson functions. The procedure has been applied to solve an unknown structure of moderate complexity and proved to be effective.