THE DIRECT DETERMINATION OF STACKING FAULTS SEQUENCE IN ZnS POLYTYPE BY HIGH RESOLUTION ELECTRON MICROSCOPY
用高分辨电子显微术直接鉴定ZnS多型体中堆垛序列和缺陷

Lattice imaging with tilted illumination at the 3.12? level has been used for direct determination of stacking sequences in ZnS polytype by observing electron micrographs. The method employed is used to reveal the stacking sequences in the disordered and faulted ZnS.