NORMAL ONE BEAM MODEL FOR FOURIER TRANSFORM ANALYSIS METHOD OF PHOTOELECTRON DIFFRACTION SPECTRUM
光电子衍射谱Fourier变换分析方法的垂直单电子束模型

Using normal one beam model, an analytical formula of normal photoelectron diffraction (NPD) I-V curves is derived. For the system C(2×2) Se (3d)/Ni(001), NPD spectrum and phase shifts have been calculated. We find the "layer spacing modification" (LSM) from phase shifts. In the other hand, the LSM has been found by Fourier transformation of NPD spectrum. These two sets of LSM are shown to be very close to each other. Thus it is demonstrated that Fourier transformation of NPD spectrum could be used as an effective me-thod for surface structure determination.