Computation of Reliability and Bayesian Analysis of System Reliability for Mukherjee Islam Failure Model

The Mukherjee Islam Failure Model is considered as a simple model to assess component reliability and may exhibit a better fit for failure data and also provide more appropriate information about hazard rate. This paper presents the reliability computation and Bayesian estimation of system reliability when the applied stress and strength follows the Mukherjee Islam Failure Model. The results obtained in this paper may be applied to semiconductor devices. The main objective of this paper is to compute reliability and Bayesian analysis of system reliability. Maximum likelihood estimator and Bayesian methods are used inside the paper.