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Investigation of Mutants Induced in Durum Wheat (Triticum durum Desf.) for Yield and Some Agronomic and Quality Traits

Keywords: Durum wheat , mutant , grain yield , yellowberry kernel , lodging

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Abstract:

The aim of the study was to select mutant lines having a better agronomic potential than the mother variety Sofu of durum wheat (Triticum durum Desf.) in the M6 and M7 generations. The seeds were either irradiated with g rays at Cobalt 60 (60Co) or treated with Ethyl-Methane-Sulfonate (EMS). Selection of mutants was carried out in the segregating (M2, M3) generations. Mutants were first tested for yield and other agronomic characteristics in the M4 and M5 generations. Twelve selected mutants and the mother variety Sofu were examined in the M6 and M7 generations for yield and quality characteristics. The experiments were organized in a Randomized Complete Block Design with 3 replications. Results revealed that any of these mutants could be used directly as new varieties. However, Sfga-7 showed yield stability across different environments, but the increases were not significant compared with Sofu. Sfga-5 had percentages of yellowberry kernels close to those of Sofu in both generations. This line with its high quality is a promising parent candidate for quality breeding. Therefore, more information on the new years and locations would greatly facilitate the evaluation of these lines. In addition, the utilization of the reduced plant height of Sfga-8 by crossing to the Sofu or other varieties could give rise to new lines whose agronomic features could be superior to those of both parents.

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