An approach enabling accelerated shooting and bouncing rays (SBR) simulations to determine the backscattering properties of electrically large and complex objects is presented. Instead of performing independent simulations for all required aspect angles, the concept is based on the idea of additionally exploiting bistatic information for some neighboring aspect angles. Therefore the results of the geometrical ray tracing, which consumes a large part of the computational resources in case of complex shaped objects can be reused multiple times with only low additional computational resources. This method works well for objects with a sufficiently smooth shape and if a large number of aspect angles is to be simulated. A simple generic simulation example is used to show the general applicability of the method and to examine the degradation of the results depending on the applied bistatic angle. Furthermore, the acceleration that can be expected by the presented approach is determined and verified with the simulation example.