Numerical simulation of measuring the minority carrier lifetime based on the ZERBST method
基于ZERBST方法的少子寿命测量的数值仿真验证

This paper gives out the simulation result of the recovery characteristic of the MIS structure, which is one of the mainstream methods to examine the minority carrier lifetime, with using the 2 Dimension numerical device simulator MEDICI. Then, the lifetime is calculated by the method of ZERBST, and the calculated result is close to the pre-set value, which means the ZERBST method is useful. This simulation method gives a significant guide to the real lifetime measurement.