Hu Zhigao,Wang Genshui,Huang Zhiming,et al.Optical properties of Bi3.25La0.75Ti3O12 thin films using spectroscopic ellipsometry[J].J.Appl.Phys.,2003,93:3811-3815.
[2]
Wang G S,Meng X J,Lai Z Q,et al.Structural and optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films prepared by chemical solution routes[J].Appl.Phys.A.,2003,76:83-86.
[3]
Idink H,Srikanth V,White W B,et al.Raman study of low temperature phase transitions in bismuth titanate,Bi4Ti3O12[J].J.Appl.Phys.,1994,76:1819-1823.
[4]
Kojima S,Imaizumi R,Hamazaki S,et al.Raman scattering study of bismuth layer-structure ferroelectrics[J].Jpn.J.Appl.Phys.,1994,33:5559-5564.
[5]
Park B H,Kang B S,Bu S D,et al.Lanthanum-substituted bismuth titanate for use in non-volatile memories[J].Nature,1999,401:682-684.
[6]
Watanae T,Funakubo H.Effect of cosubstitution of La and V in Bi4Ti3O12 thin films on the low-temperature deposition[J].Appl.Phys.Lett.,2002,80:100-102.
[7]
Hu S H,Chen J,Hu Z G,et al.The optical properties of Bi3.25La0.75Ti3O12 thin films with different thickness prepared by chemical solution deposition[J].Materials Research Bulletin,2004,39:1223-1229.
[8]
SU Qing-Feng,XIA Yi-Ben,WANG Lin-Jun,et al.Studies on infrared spectroscopic ellipsometry of different oriented CVD diamond films[J].J.Infrared Millim.Waves(苏青峰,夏义本,王林军,等.不同取向金刚石薄膜的红外椭圆偏振光谱特性研究.红外与毫米波学报),2006,25(2):86-89.
[9]
CHENG Xing-Kui,LIAN Jie,WANG Qing-Pu,et al.Measurement of response peak wavelength of quantum well infrared detectors by Raman scattering[J].J.Infrared Millim.Waves(程兴奎,连洁,王青圃,等.量子阱红外探测器响应峰值波长的Raman散射测量.红外与毫米波学报),2005,24(2):97-99.
