[ Paul C R, H ard in K B. D iagnos is and reduction o f conducted no ise em ission[ J]. IEEE T rans on E lectrom agne-t ic Compatib ility, 1988, 33( 4): 553-560.
[2]
[ Guo T, Chen D Y. Separation o f the common-m ode and d ifferentia-lm ode conducted EM I no ise [ J]. IEEE Trans Pow er E lec tron ics, 1996, 11( 3) : 480-488.
[3]
[ Zhao Y, See K Y. D iagnosis Ne tw ork Pe rfo rm ance For Conducted EM IM easurem ent[ R] . Oh io: IEEE AP-S D-i gest, 2003.
[4]
[ Zhao Y, SeeK Y, Li S J. No ise D iagnos is Techn iques in Conducted E lectrom agnetic Interference ( EM I) M easurem ent: M ethods Analysis and Design[ R]. CA: IEEE APS D ig est, 2004.
[5]
[ LoY K, Ch iu H J, Song T H. A softw are-based CM and DM m easurem ent system fo r conducted EM I [ J]. IEEE Trans on Industr ia l E lec tron ics, 2000, 47( 4) : 977-978.
[6]
[ N ave M ark J. Pow er Line F ilte r Design for Sw itched ) M ode Pow er Supplies[M ]. New York: Van Nostrand Reinho ld, 1991. 1446-1447.
