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纳秒脉冲下温度、频率对尼龙6电老化的影响

DOI: 10.13336/j.1003-6520.hve.2015.04.035, PP. 1334-1341

Keywords: 尼龙6,电树枝,ns脉冲,电老化,PTFE,PMMA

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Abstract:

尼龙6作为绝缘材料经过长时间运行后,绝缘性能会受老化的影响而劣化。目前对此类绝缘材料的研究多集中在常温和工频下,在ns脉冲条件下的研究较少。为了研究温度、频率对尼龙6中电树枝引发的影响,实验采用了固态ns脉冲发生器MPC50D为激励源,其具有30ns的下降沿和70ns的脉冲宽度;使用温度循环实验箱SP-80U控制实验温度。实验的温度设定为-40~60℃,频率设定为20~1500Hz。实验结果表明温度对尼龙6中的电树枝引发电压有明显的影响,随温度的升高电树枝引发电压下降明显;频率对电树枝的影响并不明显,只在200Hz以下出现了较明显的趋势;尼龙6、聚四氟乙烯(PTFE)和有机玻璃(PMMA)中的电树枝形态差异巨大,尼龙6中为丛林形,PTFE中为树枝形,PMMA中为层裂形;ns脉冲下击穿通道出现了放电引发的扇形结构。实验数据为尼龙6在ns脉冲下的绝缘应用提供了参考。

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