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触点动态接触电阻时间序列混沌预测

, PP. 187-193

Keywords: 动态接触电阻,时间序列,最大Lyapunov指数,混沌预测

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Abstract:

触点电接触性能的稳定性直接影响继电器乃至整个系统的可靠性,而接触电阻是表征触点电接触性能的重要参数之一,基于混沌理论对触点动态接触电阻峰值时间序列进行分析,并验证了混沌预测的有效性。首先对动态接触电阻峰值时间序列数据进行相空间重构,确定了接触电阻序列的最佳嵌入维数m和延迟时间τ。在说明动态接触电阻峰值时间序列具有混沌特性的基础上,根据最大Lyapunov指数对触点动态接触电阻峰值时间序列进行了混沌预测,并给出了混沌预测的可靠范围。预测结果与试验数据对比发现,混沌预测短期效果较好。本文分析了触点动态接触电阻峰值时间序列的混沌特性,为触点电接触可靠性研究提供了新思路。

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