We prepared CuO-Ta2O5 composite films by our simple
co-sputtering method using three CuO pellets and a Ta2O5 disc as a co-sputtering target, and subsequently annealed the films in ambient
air at 900℃, 1000℃, and 1100℃ for 20 min. We evaluated photoluminescence (PL) and X-ray diffraction
properties of the annealed films, and discussed the relationship between sharp
PL peaks (λ ~ 450 nm) observed from all the films and their crystallizabilities. We
considered that the 450-nm peaks originated from Cu2.1(Ta4O12)
crystal phases in the films.
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